Quality and metrology
불량 분석
failure analysis
DraftVersion 0.1.1Updated 2026-10-09
- Definition(Written in Korean)
- 불량 칩을 단면 절단, 전자현미경, 전기 측정으로 파고들어 물리적 원인을 찾는 일입니다.
- Synonyms
- FA
- English
- failure analysis
- Related terms
- 공통성 분석commonality analysis결함defect
- Added in version
- 0.1.0
- Permanent URI
https://ontocraft.com/terms/semi-failure-analysis
JSON-LD for this term- Citation
- OntoCraft Korean Industrial Term Registry, “불량 분석” (failure analysis), version 0.1.1, https://ontocraft.com/terms/semi-failure-analysis, CC BY 4.0.
CC BY 4.0. Source: OntoCraft Korean Industrial Term Registry · License text